216th ECS Meeting - Vienna, Austria |
October 4 - October 9, 2009 |
PROGRAM INFORMATION |
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E9 - State-of-the-Art Program on Compound Semiconductors 51 (SOTAPOCS 51) and Wide-Bandgap Semiconductor Materials & Devices 10 |
Electronics and Photonics/Sensor |
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Tuesday, October 6, 2009 |
Room E558, Level OE - Yellow |
Advanced materials & devices |
| Co-Chairs: E. Stokes, O. Ambacher |
| Time | Abs# | Title and Authors |
| 08:00 |
2320
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Diamond FET Arrays for Biosensors and Bioelectronics
J. A. Garrido, M. Dankerl, M. Hauf, A. Reitinger, and M. Stutzmann (Walter Schottky Institut, Technische Universität München)
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| 08:40 |
2321
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Development of Lateral Quantum Dots with Cryogenic Silicon Circuit Assisted Read-Out
M. Carroll, E. Nordberg, T. Gurrieri, K. Eng, G. Ten Eyck, and M. Lilly (Sandia National Laboratories)
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| 09:20 |
2322
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Facet Specific Gold Tip Growth on Semiconductor Nanorod Assemblies
C. O'Sullivan, S. Ahmed, R. Gunning, C. Barrett, H. Geaney, A. Sanyal, A. Singh, and K. Ryan (University of Limerick)
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| 09:40 |
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Intermission (20 Minutes)
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| 10:00 |
2323
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Novel Inorganic-Organic Hybrid Semiconductors with Extraordinary Properties
Y. Zhang (The University of North Carolina)
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| 10:40 |
2324
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The Growth of Semiconductor and Dielectric Nanowire and Nanowire Arrays and their Plasmonic Applications.
S. Prokes, L. Mazeina, D. Alexson, O. Glembocki, H. Park, H. Qi, and R. Rendell (Naval Research Lab)
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| 11:20 |
2325
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Electrochemical Sensing with Diamond Nanotips
C. Nebel, N. Yang, and W. Smirnov (Fraunhofer Institute IAF)
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III-nitrides |
| Co-Chairs: E. Kohn, JJ Huang |
| Time | Abs# | Title and Authors |
| 14:00 |
2326
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Group III-Nitrides: From Bioelectronics to Nanosensors
M. Eickhoff (I. Physikalisches Institut)
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| 14:40 |
2327
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Au Free Ohmic Contacts for High Temperature InAlN/GaN HEMTs
M. Alomari, D. Maier (Institute of Electron Devices and Circuits (EBS)), J. Carlin, N. Grandjean (École Polytechnique Fédérale de Lausanne), M. Poisson, S. Delage (Alcatel-Thales III/V Lab), and E. Kohn (University of Ulm)
|
| 15:20 |
2328
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Nanocrystal LEDs by Spray Layer-by-Layer Deposition
T. Otto, P. Mundra, D. Dorfs, M. Schelter, J. Poppe, E. Frolova, V. Lesnyak, N. Gaponik, and A. Eychmüller (TU Dresden)
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| 16:00 |
2329
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Optoelectronic Properties of AlGaN-Films Studied by Means of Ellipsometry
C. Cobet (ISAS - Institute for Analytical Sciences), C. Werner, M. Röppischer, N. Esser (Institute for Analytical Sciences), and R. Goldhahn (Technical University of Ilmenau)
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| 16:40 |
2330
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Defect Reduction through Confined Epitaxy of GaN on SiC
J. Hite, C. R. Eddy Jr., and M. Mastro (U.S. Naval Research Laboratory)
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| 17:20 |
2331
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Characterizations of Sidewall Reflected GaN-Based LEDs Using Self-Aligned Nanorod Arrays as Localized Photonic Crystals
Y. Cheng, K. Pan, L. Chen, M. Ke, C. Chen, and J. Huang (National Taiwan University)
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| 17:40 |
2332
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Enhanced Vertical Emission from GaN Based Light Emitting Diode with ZnO Nanorod Arrays Produced by Hydrothermal Method
S. Dalui, C. Lin (Insititute of Microelectronics, National Cheng Kung University), H. Lee (Department of Electro-Optical Engineering, National Cheng Kung University), and C. Lee (National Cheng Kung University)
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| 18:00 |
2333
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Electron-Beam Evaporation of Distinctive Indium-Tin-Oxide Nanorods for Enhanced Light Extraction from InGaN/GaN Light Emitting Diodes
C. Chiu, M. Tsai, P. Yu, and H. Kuo (National Chiao Tung University)
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Gallery, Level 01 - Green |
Poster |
| Co-Chairs: E. Stokes, C. O'Dwyer |
| Time | Abs# | Title and Authors |
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2334
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Strain Relaxation and Emission Characteristics of Size-Dependent InGaN/GaN Nanorod Arrays
C. Chiu, P. Yu, H. Kuo (National Chiao Tung University), T. Lu, S. Wang (Institute of Electro-Optical Engineering,National Chiao Tung University), C. Chang, and Y. Wu (Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.)
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| o |
2335
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InGaN-Based Light-Emitting Diodes with the Photoelectrochemical Treated Microhole Array Structures
C. Lin and C. Lin (National Chung Hsing University)
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| o |
2336
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Nanostructured Surface Morphology of ZnO Grown On A-Plane GaN
C. Chen, C. Pan, F. Tsao, Y. Liu, G. Chi (National Central University), C. Chang (University of Florida), and T. Hsueh (National Cheng Kung University)
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| o |
2337
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Local Vibration Modes of N-H Related Complexes in GaAsN Grown by Chemical Beam Epitaxy
H. Suzuki, T. Tanaka, Y. Ohshita, N. Kojima, and M. Yamaguchi (Toyota Technological Institute)
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| o |
2338
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Suppression of Leakage Current of AlGaN/GaN HEMT by HF Treatment
Y. Choi, J. Lim, Y. Kim, and M. Han (Seoul National University)
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Wednesday, October 7, 2009 |
Room E558, Level OE - Yellow |
Oxide semiconductors |
| Co-Chairs: C. O'Dwyer, R. Goldhahn |
| Time | Abs# | Title and Authors |
| 08:00 |
2339
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Effect of Doping on the Optical and Structural Properties of ZnO Thin Films Prepared by RF Diode Sputtering
K. Shtereva (University of Rousse), V. Tvarozek (Slovak University of Technology), P. Sutta (West Bohemian University), I. Novotny, and A. Pullmannova (Slovak University of Technology)
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| 08:40 |
2340
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Wide Bandgap Oxide Semiconductors for Novel Functions and Applications
S. Fujita, T. Oshima, and K. Kaneko (Kyoto University)
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| 09:00 |
2341
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High-Operating Current ZnO Based Thin Film Transistors with a Bilayer ZnO/GZO Channel
K. Liu, H. Chiang, S. Hsiao, L. Su, L. Peng, and J. Huang (National Taiwan University)
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| 09:20 |
2342
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Fabrication and Characterization of Zinc Oxide Nanorods Based Heterojunction Devices using Simple Solution Method
N. Reddy, S. Kim, E. Lee, and Y. Hahn (Chonbuk National University)
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Silicon carbide |
| Co-Chairs: E. Stokes, G. Hunter |
| Time | Abs# | Title and Authors |
| 10:00 |
2343
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SiC Power Device Technology: Differences to Silicon and Their Influence on Device Processing and Performance
P. Friedrichs (SiCED GmbH & Co. KG)
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| 10:40 |
2344
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On the Driving Force of Shockley Stacking Fault Motion in 4H-SiC
J. D. Caldwell, R. Stahlbush, M. Ancona (U.S. Naval Research Laboratory), O. Glembocki (Naval Research Lab), and K. Hobart (U.S. Naval Research Laboratory)
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| 11:20 |
2345
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Correlation of Substrate Quality and Epitaxial Layer Lifetime and Defectivity in 4H-SiC Homoepitaxy
C. R. Eddy Jr. (U.S. Naval Research Laboratory), B. VanMil (Amethyst Research), K. Lew, R. Myers-Ward (U.S. Naval Research Laboratory), J. Tedesco (US Naval Research Laboratory), R. Stahlbush, J. D. Caldwell, and D. Gaskill (U.S. Naval Research Laboratory)
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| 12:00 |
2346
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4H-SiC on C-Plane Sapphire with C60
J. Li (UNC at charlotte), P. Batoni (UNC), and R. Tsu (UNCC)
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